New generation of ZEISS EVO scanning electron microscope introduced
Modular platform for intuitive operation, routine investigations and research applications JENA/Germany, 2017-11-02. ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of... Read more