November 28, 2006 (Peabody, Mass.) — JEOL USA Inc. today announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent No. 7,112,785 by the U.S. Patent and Trademark office. The patent covers the method of ionization of the DART process. This is the second U.S. patent... Read more
November 9, 2006 (Peabody, Mass.) — JEOL USA introduces the latest in imaging technology and microscopy automation with its new 120 kV high resolution Transmission Electron Microscope (TEM). This versatile instrument, the model JEM-1400, is optimized for biological, polymer, and materials research, combining both imaging and cryomicroscopy excellence. High contrast resolution is assured at 0.38nm... Read more
November 9, 2006 (Peabody, Mass.) — JEOL USA announced that it will deliver the first of its new 120kV Transmission Electron Microscopes (TEMs) to Georgia Institute of Technology in January 2007. The JEOL JEM-1400 is a versatile, compact TEM, optimized for biological, polymer, and materials research and designed for Cryo-EM applications. The TEM will be... Read more
August 9, 2006, Peabody, Mass. — A new technical paper describes the use of direct analysis in real time (AccuTOF-DART™) mass spectrometry for rapid screening and analysis of counterfeit drugs. In order to chemically fingerprint counterfeit anti-malarial drugs, Prof. Facundo Fernandez’ bioanalytical chemistry lab at Georgia Tech conducts experiments using novel mass spectrometry techniques. A... Read more
August 7, 2006, Peabody, Mass. — A new technical paper describes the use of direct analysis in real time (AccuTOF-DART™) mass spectrometry for writing ink analysis performed for forensic applications. Analysis of writing inks to authenticate documents is described in the Journal of Forensic Science, July 2006, Vol. 51, No. 4, pages 915-918 in “Differentiating... Read more
Peabody, Mass., July 25, 2006 — JEOL USA, the industry-leading supplier of electron microscopes, has installed a model JEM-2100 LaB6 Transmission Electron Microscope (TEM) at Oklahoma State University’s new microscopy service laboratory. The lab, which will serve researchers from both the university and neighboring industry, hosted an open house to introduce their expanded facilities and... Read more
Peabody, Mass., June 26, 2006 — JEOL USA has installed two transmission electron microscopes (TEMs) at the University of Texas Medical Branch’s (UTMB) newly-opened Cryo-electron Microscopy Center for Macromolecular Systems in Galveston, Texas. This facility contains the W. M. Keck Center for Virus Imaging, the first biosafety level 3 (BSL3) laboratory to house a cryo-electron... Read more
June 2006, Peabody, MA — For the sixth consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations. Through quarterly surveys of more than 150 JEOL customers,... Read more
Peabody, Mass., May 19, 2006 — JEOL, the leading manufacturer of e-beam lithography tools since 1967, announces the introduction of a new high precision direct write e-beam lithography system. The new JBX-6300FS is a spot beam, vector scan, step and repeat lithography system designed for high volume direct patterning on wafers, and is capable of... Read more
Peabody, Mass., May 19, 2006 — JEOL, the industry-leading manufacturer of high resolution Scanning Electron Microscopes (SEMs), will showcase its automated, 360 degree wafer edge review SEM in Booth 1101 in the South Hall at Semicon West 2006, Moscone Center, San Francisco. The JEOL JWS-2000 (200mm) and JWS-3000 (200/300mm) are the only wafer edge review... Read more