June 26, 2006 Microscopy

JEOL Installs Two Transmission Electron Microscopes in Nation’s First Biocontainment Laboratory for the Study of Live Viruses

Peabody, Mass., June 26, 2006 — JEOL USA has installed two transmission electron microscopes (TEMs) at the University of Texas Medical Branch’s (UTMB) newly-opened Cryo-electron Microscopy Center for Macromolecular Systems in Galveston, Texas. This facility contains the W. M. Keck Center for Virus Imaging, the first biosafety level 3 (BSL3) laboratory to house a cryo-electron... Read more

June 1, 2006 PR/Corporate

JEOL USA Receives Sixth Consecutive Omega Award for Service

June 2006, Peabody, MA — For the sixth consecutive year, JEOL USA, Inc., a leader in the manufacture, sales, and service of electron microscopes and analytical instruments, has received the Omega Northface Award in recognition for its commitment to providing exemplary service and exceeding customer expectations. Through quarterly surveys of more than 150 JEOL customers,... Read more

May 19, 2006 Microscopy Product Launch

JEOL Introduces New High Resolution Direct Write System

Peabody, Mass., May 19, 2006 — JEOL, the leading manufacturer of e-beam lithography tools since 1967, announces the introduction of a new high precision direct write e-beam lithography system. The new JBX-6300FS is a spot beam, vector scan, step and repeat lithography system designed for high volume direct patterning on wafers, and is capable of... Read more

May 19, 2006 Microscopy

Full Circumference Wafer Edge Review SEM at Semicon West 2006

Peabody, Mass., May 19, 2006 —  JEOL, the industry-leading manufacturer of high resolution Scanning Electron Microscopes (SEMs), will showcase its automated, 360 degree wafer edge review SEM in Booth 1101 in the South Hall at Semicon West 2006, Moscone Center, San Francisco. The JEOL JWS-2000 (200mm) and JWS-3000 (200/300mm) are the only wafer edge review... Read more

May 17, 2006 Microscopy

JEOL Introduces Ultrahigh Resolution Field Emission SEM for Nanotechnology

Peabody, Mass., May 17, 2006 —  JEOL USA, a leading manufacturer of electron microscopes and analytical instruments, introduces a new ultra-high resolution Field Emission Scanning Electron Microscope (SEM) with advanced optics that clearly reveal intricate surface details during observation of nano structures of medical, biological, materials science, and semiconductor samples. Unique in-lens performance with semi-in... Read more

April 17, 2006 Microscopy

Untethered TEM

Peabody, Mass., April 17, 2006 —  JEOL USA recently demonstrated a revolutionary remote capability for operating a transmission electron microscope (TEM) using a laptop computer with a cellular network connection. While seated at a picnic table 300 miles away, JEOL applications specialists manned the controls of a JEM-2200FS TEM operated at Lehigh University in Pennsylvania.... Read more

April 7, 2006 Uncategorized

JEOL USA Sales Director, Peter Genovese, Promoted to Vice President

Peabody, Mass., April 7, 2006 – JEOL USA, a leading supplier of electron microscopes and analytical instruments with annual sales of more than $100 million, has appointed Sales Director Peter Genovese to the position of Vice President. Mr. Genovese has held successive management positions in the sales organization since joining JEOL in 1983. He manages... Read more

March 17, 2006 Mass Spectrometry Product Launch

New Direct Analysis Mass Spec Applications Notebook (Volume 2)

Peabody, Mass., March 17, 2006 — A new applications notebook from JEOL USA comprises more than 25 recent applications notes resulting from analyses using the AccuTOF™ DART™ (Direct Analysis in Real Time) mass spectrometer. The broad range of applications in this second volume of notes published since the introduction of DART includes pharmaceuticals, foods, industrial... Read more

March 9, 2006 Product Launch

New Single-Beam FIB Offers Unique Cost Performance

Peabody, Mass., March 9, 2006 — A new single-column focused ion beam (FIB) system from JEOL makes automated, high-speed specimen preparation affordable at nearly one-third the cost of dual beam FIBs. The JEOL JEM-9320 FIB prepares thin films and cross sections for failure and defect analysis at the nanoscale using S/TEM, TEM or surface observation.... Read more

February 14, 2006 Atomic Spectroscopy

JEOL Demonstrates Latest Scientific Instruments at Pittcon 2006 — March 13<sup>th</sup>-16<sup>th</sup>

Peabody, Mass., February 14, 2006 – Live demos of a new low vacuum, high resolution SEM, direct analysis in real time mass spectrometer (AccuTOF-DART™), and remote operation of ECA/ECX NMR spectroscopy systems will be ongoing in the JEOL booth, #2132 and 2133 at the Orange County Convention Center West Building, Orlando, Florida. SEM Technology Throughout... Read more