One of the world’s leading electron microscopes at Oak Ridge National Laboratory, the JEOL 2200FS Aberration Corrected Electron Microscope (ACEM), is controlled and manipulated from London via the Lambda Rail. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/85/Cross-Atlantic-Operation-of-JEOL-2200FS-Aberration-Corrected-Electron-Microscope Read more
The recent acquisition of Jeol’s latest 300 kV field emission Transmission Electron Microscope (TEM), the JEM-3200FS, by Indiana University in the US for studying viruses is symptomatic of the ever increasing need for structural information about viruses to aid in the drug discovery process. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/84/JEOL-Puts-Viruses-Under-the-Microscope- Read more
October 11, 2007 (Cambridge, Mass.) — Massachusetts Institute of Technology and the Consulate General of Japan in Boston hosted a seminar on Advanced Materials presented by Professor Akihisa Inoue, President of Tohoku University of Japan. Prof. Inoue addressed an audience of MIT materials science students and faculty, as well as representatives from JEOL USA who... Read more
October 2, 2007 (Peabody, Mass.) — Get the latest in mass spectrometry applications and news from JEOL USA through its new online newsletter, Mass Media. Launched to meet the needs of the growing JEOL community of mass spec users, the newsletter includes links to newly-published papers by renowned scientists using JEOL mass spectrometers, new applications... Read more
August 23, 2007 (Peabody, Mass.) — JEOL USA received a distinguished visitor at its Peabody, Massachusetts office on Tuesday, August 21st, when the 2007 Ernst Ruska Prize winner, Professor Hiroshi Jinnai of Kyoto Institute of Technology, visited JEOL’s U.S. headquarters. Dr. Jinnai, an invited speaker at the American Chemical Society Fall conference held in Boston... Read more
Wesleyan’s Advanced Instrumentation Center has scoped out better way to conduct infinitesimal scientific research. In the past six months, the center has acquired a new, state-of-the art scanning electron microscope (JEOL JSM-6390LV SEM) for 3-D imaging, and a transmission electron microscope (JEOL JEM-1011 TEM) for 2-D sample images. https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/83/New-Microscopes-Aid-Wesleyan-Researchers Read more
August 7 , 2007 (Peabody, Mass.) — JEOL USA will introduce and demonstrate a new compact, high-performance, 400MHz NMR spectrometer at ACS Fall 2007, August 20-22, in booth #919-921. The company will unveil the recently announced ECS-400 Nuclear Magnetic Resonance Spectrometer, featuring the new Jastec 400 MHz Super Self-Shielded superconducting magnet. The new, fully-digital ECS-400... Read more
August 2, 2007 (Peabody, Mass.) — JEOL USA, a leading supplier of electron microscopes and scientific instruments for nanotechnology, announced today that it has completed installation and acceptance of its first thermal field emission electron microprobe in the United States. The microprobe was installed at NIST in Gaithersburg, Maryland, in one of the world’s most... Read more
June 25, 2007 (Peabody, Mass.) — JEOL USA has recently published the third edition of its popular AccuTOF-DART Direct Analysis in Real Time mass spectrometry applications notebook. The updated booklet contains new data on chemical reaction monitoring and detection of the peroxide explosives TATP and HMTD. A compilation of 28 applications notes describes analyses performed... Read more
New ink sampling technique takes a bite out of time https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/82/Ames-Laboratory-uses-DART-Mass-Spectrometry-to-Analyze-Inks-and-build-Sample-Library Read more