With a legacy of commitment to customer support, JEOL USA is pleased to accept its 8th award in as many years for excellence in customer satisfaction as judged by our customers. The Omega NorthFace ScoreBoard Award was presented in May at Boston’s World Trade Center to 27 qualifying companies, including JEOL and three other companies... Read more
May 13, 2008 (Peabody, Mass.) — JEOL USA has published the fourth edition of its popular collection of applications notes for open air mass spectrometry. The AccuTOF-DART Applications Notebook 4th edition is updated to include several new applications notes covering topics as diverse as real-time analysis of deoxynivalenol in beer to GC/MS using the DART™... Read more
March 3, 2008 (Pittcon 2008, New Orleans, LA) — Two of the world’s leading imaging equipment suppliers – Nikon Instruments and JEOL – have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana. “The NeoScope partnership... Read more
Introduction In a recently published comparison1 of the ambient ionization techniques direct analysis in real time (DART™ 2) and DESI3, it was reported that a protonated molecule was not observed for DART, whereas the protonated molecule could be observed for DESI and DAPCI. This is an incorrect observation, resulting from the use of different experimental... Read more
January 15, 2007 (Peabody, Mass.) — JEOL USA announced today that Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts. As a result of Boston College’s continued investment in the sciences, the university opened its first... Read more
January 7, 2008 (Peabody, Mass.) — JEOL USA introduces a new mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed. The new CarryScope is the ideal instrument for the mobile crime lab where imaging and analysis of trace evidence are conducted right at the crime scene. In the... Read more
The World’s First Circular Dichroism Detector for Ultra High Pressure Liquid Chromatography Chiral separation has become one of the most important application areas in HPLC, including the use of ultra-high pressure HPLC (X-LC®). The increasing demand for chiral chromatography in various fields, such as drug analysis, drug discovery, biochemical analysis, natural product analysis, organic synthesis,... Read more
This year JASCO celebrates its 50th anniversary in the analytical instrumentation market. The company was founded in 1958 by a group of researchers at the Institute of Optics, at what is now Tsukuba University, who required an infrared spectrophotometer for their research. Since a commercially available instrument did not exist in Japan, they undertook the... Read more
November 27, 2007, Peabody, Mass. — JEOL USA introduces a new high throughput SEM/FIB that combines Focused Ion Beam micro milling with the high resolution imaging of the JEOL LaB6 electron column. The MultiBeam is a high-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair. A versatile all-in-one... Read more
November 5, 2007 (Peabody, Mass.) — JEOL USA announced today that the University of Southern California (USC) has purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university’s Center for Nano-Imaging in Los Angeles, California. USC is the first U.S. customer to purchase the new JEOL... Read more