PITTCON, Chicago, Ill.—JEOL USA, renowned for its expertise as a leading supplier of electron microscopes for research and industrial problem solving, and the College of Microscopy, the education division of The McCrone Group, are proud to announce an increased partnership and joint commitment to improving the study of microscopy. JEOL USA will provide a new... Read more
Peabody, Mass., March 6, 2009 — The new AccuTOF-GCv from JEOL features the highest sensitivity of any GC time-of-flight mass spectrometer commercially available. By combining rapid data acquisition speeds with high resolution and a high dynamic range, the AccuTOF-GCv delivers exact mass measurements for both qualitative and quantitative analysis. The new AccuTOF-GCv introduces several new... Read more
Peabody, Mass., March 5, 2009 — JEOL, renowned for its role in the development and manufacture of advanced electron microscopy and spectroscopy products since 1949, kicks off its 60th anniversary celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences. Pittcon, also celebrating its 60th anniversary, is known for being... Read more
JEOL, renowned for its expertise in the manufacture and applications support of scientific instrumentation for sixty years, has produced a new brochure for 2009 describing electron microscopy and mass spectrometry solutions for forensic science. The brochure includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links... Read more
February3, 2009 (Peabody, Mass.) — JEOL USA is pleased to offer the latest tomography solutions for transmission electron microscopy (TEM). Tomography, or three-dimensional (3D) reconstruction of multiple TEM images, has developed in the past decade as one of the more important applications in the field of life sciences and, more recently, in the field of... Read more
January 6, 2009 (Peabody, Mass.) — JEOL USA will install the first e-beam direct-write-on-wafer lithography tool to support nanoscience research in the Pacific Northwest when the University of Washington takes delivery of a JEOL JBX-6300FS e-beam system. The system will be installed in the state-funded Washington Technology Center Microfabrication Lab. Funding for the tool acquisition... Read more
JASCO’S Featured Product at PITTCON 2009 Preparative SFC System with Chiral Detection JASCO’s featured product at Pittcon 2009 will be the Preparative SFC system with chiral detection. Providing a versatile modular design and excellent performance, this system is the ideal solution for fast, reliable chiral separation and isolation. The heart of the system is JASCO’S... Read more
October 28, 2008 – Peabody, Massachusetts – Electron microscope leader JEOL USA hosted a special visit recently from renowned materials scientist Dr. Akihisa Inoue, President of Tohoku University in Sendai, Japan. Dr. Inoue’s research in a new class of bulk amorphous metals has made a major impact on subsequent research into new materials around the... Read more
October 29, 2008 – Peabody, Mass. – First it was pets, now it is babies who have died from ingesting food tainted with melamine. Detection of this chemical compound, which is being maliciously added to food products to make them appear to contain higher levels of protein, takes on a new urgency in a global... Read more
Peabody, Mass., October 15, 2008 – Two of JEOL’s top-of-the-line cryo-electron microscopes will be key instrumentation for multi-disciplinary scientific advances in a new $1 billion research center in Kannapolis, North Carolina. The David H. Murdock Research Institute (DHMRI) has selected JEOL’s high resolution electron microscopes for its world-class laboratory, which will serve as a central... Read more