Nikon and JEOL Join Forces to Introduce NeoScope Benchtop SEM
March 3, 2008 (Pittcon 2008, New Orleans, LA) — Two of the world’s leading imaging equipment suppliers – Nikon Instruments and JEOL – have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana. “The NeoScope partnership... Read more