July 30, 2008 (Peabody, Mass.) — From the exhibition hall at the 2008 Microscopy and Microanalysis Conference in Albuquerque, New Mexico, JEOL USA will demonstrate – via remote operation – three of its more than 30 JEOL TEMs currently using Sirius™ Remote TEM software and internet or wireless connections. Visitors to the booth will be... Read more
July 31, 2008 (Peabody, Mass.) — JEOL USA will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F, at M&M 2008 in Albuquerque, New Mexico in its booth #1027. Featuring the highest beam current available on any FEG SEM, the JSM-7600F integrates a semi-in-lens objective lens with an in-lens... Read more
July 30, 2008 (Peabody, Mass.) — JEOL USA will demonstrate both of its new MultiBeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam “power tools” at M&M 2008. The LaB6 model, the JIB-4500 MultiBeam, was introduced in December 2007 and has already gained wide acceptance, with recent installations at nanotechnology research... Read more
July 28, 2008 (Peabody, Mass.) — JEOL USA will host a tutorial session at M&M 2008 in conjunction with Oak Ridge National Laboratory (ORNL) and Protochips to introduce PRISM – Practical Remote In Situ Microscopy. The PRISM tutorial will be held on Monday, August 4, 2008 at the Microscopy & Microanalysis (M&M) Exhibit in Albuquerque,... Read more
July 28, 2008 (Peabody, MA) — JEOL, the global leader in electron microscopy for nearly 60 years, will demonstrate a variety of new software packages for its 120kV to 300kV series of Transmission Electron Microscopes (TEMs) in booth #1027 at the M&M 2008 Microscopy and Microanalysis exhibit in Albuquerque, New Mexico from August 4-7. Exploring... Read more
See the new JEOL lineup: Power Tools for Microscopy and Sample Processing https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/86/JEOL-Debuts-New-Products-at-MM-2008 Read more
Quantitative measurement method based on FRAP and FRAPa using multiphoton microscopy. We present a new convenient method for quantitative three-dimensionally resolved diffusion measurements based on the photobleaching (FRAP) or photoactivation (FRAPa) of a disk-shaped area by the scanning laser beam of a multiphoton microscope. Contrary to previously reported spot-photobleaching protocols, this method has the advantage... Read more
JASCO and Princeton Chromatography are pleased to announce a new collaboration in the areas of Supercritical Fluid Chromatography (SFC) instrumentation and Supercritical Fluid Chromatography column manufacturing. JASCO, with U.S. offices in Easton, MD, manufactures both analytical and preparative supercritical fluid chromatography systems. SFC offers an excellent alternative to normal phase HPLC with the advantages of... Read more
With a legacy of commitment to customer support, JEOL USA is pleased to accept its 8th award in as many years for excellence in customer satisfaction as judged by our customers. The Omega NorthFace ScoreBoard Award was presented in May at Boston’s World Trade Center to 27 qualifying companies, including JEOL and three other companies... Read more
May 13, 2008 (Peabody, Mass.) — JEOL USA has published the fourth edition of its popular collection of applications notes for open air mass spectrometry. The AccuTOF-DART Applications Notebook 4th edition is updated to include several new applications notes covering topics as diverse as real-time analysis of deoxynivalenol in beer to GC/MS using the DART™... Read more