October 23, 2009 Microscopy Product Launch

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere

October 21, 2009, Peabody, Mass. — JEOL, a global leader in the development and manufacture of scanning and transmission electron microscopes, introduces ClairScope™, a first-of-its kind correlative microscopy tool that combines a high-end Light Microscope (LM) with a high-resolution Atmospheric Scanning Electron Microscope (ASEM). The new JEOL ClairScope enables uncompromised observation of samples in their... Read more

September 10, 2009 Acad, Gov/Utilities Microscopy

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University

With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new... Read more

August 11, 2009 Microscopy

Download SEM Theory and Operation Books from JEOL Website

August 11, 2009 (Peabody, Mass.) — JEOL, a leading supplier of high resolution, high performance Scanning Electron Microscopes (SEM) and atomic resolution Transmission Electron Microscopes (TEM), has developed two new publications that explain theory and operation of the SEM for routine imaging and elemental analysis. These two new books can be downloaded from the JEOL... Read more

July 1, 2009 Microscopy Product Launch

JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009

June 30, 2009 (Peabody, Mass.) — JEOL, a leading supplier of electron microscopes for ultrahigh resolution imaging and analysis, will demonstrate its new ultrahigh resolution, analytical Thermal Field Emission Scanning Electron Microscope (SEM), the JSM-7600F, via live remote viewing and control from Semicon West, San Francisco, July 14-16. The SEM will be remotely operated from... Read more

May 4, 2009 PR/Corporate

Peter Genovese Named President of JEOL USA

Peabody, Mass., April 30, 2009 — JEOL USA, the leading supplier of electron microscopes and scientific instrumentation to research labs, industry, health and investigative organizations throughout North and South America, announced the promotion of Peter Genovese to the position of President. Mr. Genovese, a member of the JEOL sales organization for more than 25 years,... Read more

April 28, 2009 Acad, Gov/Utilities Atomic Spectroscopy Product Launch

New JEOL Atomic Resolution Microscope to Aid Advanced Material Research at Florida State University

April 28, 2009 (Peabody, MA) — For now, scientists at Florida State University (FSU) can only envision what some misoriented atoms are up to along the defects of the new materials that they are developing. They’ll finally be able to clearly see each individual atom and how it relates to its neighbors when they take... Read more

March 17, 2009 Product Launch

New Standard in Electrophysiology and Deep Tissue Imaging

The function of nerve and muscle cells relies on ionic currents flowing through ion channels. These ion channels play a major role in cell physiology. One way to investigate ion channels is to use patch clamping. This method allows investigation of ion channels in detail and recording of the electric activity of different types of... Read more

March 10, 2009 Microscopy Product Launch

JEOL Unveils Highest Resolution 200kV Aberration-corrected Scanning/Transmission Electron Microscope (S/TEM)

Peabody, Mass., March 10, 2009 – The year 2009 marks the introduction of a new generation of Transmission Electron Microscope (TEM) for JEOL, as well as the 60th anniversary of the company with the longest history of innovation and leadership in electron microscopy. JEOL is pleased to introduce the new JEM-ARM200F atomic resolution analytical microscope.... Read more