JEOL Scanning Electron Microscope Offers Versatile Through-the-Lens System for Ultrahigh Resolution

August 25, 2010 (Peabody, Mass.) — JEOL has introduced a unique Scanning Electron Microscope with optics that enable ultrahigh resolution imaging at low kV and high spatial resolution microanalysis. The Through-the-Lens System (TTLS) combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun. The TTLS is designed to enable imaging... Read more

JEOL Correlative Microscope Wins MT-10 Award

August 18, 2010 (Peabody, Mass.) — The ability to examine biological samples with both electron microscopy and light microscopy using a single instrument and switching between the two with a single mouse click is garnering top honors for the JEOL ClairScope. In August, the editors of Microscopy Today magazine selected the ClairScope for the MT-10... Read more

JEOL AccuTOF-DART Mass Spectrometer Used in Georgia Institute of Technology’s Newly-Developed Ovarian Cancer Test

August 18, 2010 (Peabody, Mass.) — Called the silent killer, ovarian cancer is one of the most insidious and hardest to detect diseases. It is the leading cause of death from gynecologic cancers in the United States and, because it presents no obvious symptoms, it is often detected too late. Researchers at Georgia Institute of... Read more

New Cold Field Emission Gun Enhances Ultrahigh Atomic Level Resolution of JEOL ARM200F Aberration-Corrected S/TEM

July 20, 2010 (Peabody, Mass.) — JEOL USA is pleased to announce that a new Cold Field Emission Gun is now available for the atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its... Read more

New JEOL Correlative Microscope Makes U.S. Debut at M&M and Northwestern University after Winning R&D 100 Award

July 13, 2010 (Peabody, Mass.) – This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M)... Read more

JASCO NRS-5000/7000 Series Raman Spectrometers

JASCO is pleased to announce the release of the NRS-5000/7000 series of Raman spectrometers. Building upon the powerful capabilities of the NRS-3000 series, the NRS-5000 and NRS-7000 series instruments provide even greater features and technological innovations. The NRS-5000/7000 series instruments can integrate as many as 8 excitation lasers (9 wavelengths) from the UV to the... Read more

JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System

May 21, 2010 (Peabody, Mass.) — JEOL USA announced today the introduction of the company’s first commercially available MALDI-TOF mass spectrometer, the JEOL JMS-S3000 SpiralTOF™. The SpiralTOF reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint, delivering a resolving power of greater than 60,000 (FWHM) over a wide mass range of... Read more

ELS-2040/2041 Evaporative Light Scattering Detector

JASCO is pleased to announce the release of the ELS-2040/2041 series of Evaporative Light Scattering Detectors. The JASCO ELSD can be utilized for a wide range of analytical techniques, including HPLC, LC/MS, and SFC. The range of application areas is equally broad, encompassing pharmaceuticals, nutraceuticals, combinatorial libraries, carbohydrates, lipids, phospholipids, triglycerides, fatty acids, amino acids,... Read more