JEOL Scanning Electron Microscope Offers Versatile Through-the-Lens System for Ultrahigh Resolution
August 25, 2010 (Peabody, Mass.) — JEOL has introduced a unique Scanning Electron Microscope with optics that enable ultrahigh resolution imaging at low kV and high spatial resolution microanalysis. The Through-the-Lens System (TTLS) combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun. The TTLS is designed to enable imaging... Read more