June 30, 2011 (Peabody, MA) — The JEOL InTouchScope™ SEM, a touchscreen-controlled analytical, portable low vacuum Scanning Electron Microscope, has been recognized by the editors of R&D Magazine as one of the 100 most technologically significant products introduced into the marketplace over the past year. “This is a significant honor for JEOL because the InTouchScope... Read more
May 31, 2011 (Peabody, MA) — JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification... Read more
JEOL’s atomic resolution Transmission Electron Microscope (TEM), the JEM-ARM200F, sets a new standard for rapidly resuming operation after flashing, a routine procedure conducted with any TEM featuring a Cold FEG source. Long considered a tradeoff for the higher resolution, higher brightness, and smaller energy spread of a cold FEG TEM, emission stability degrades due to... Read more
JASCO featured the New! FP-8000 series of spectrofluorometers during Pittcon 2011. Building upon the powerful capabilities of the FP-6000 series, the FP-8000 series instruments provide even greater features and technological innovations. The JASCO FP-8000 Series spectrofluorometers incorporate the highest sensitivity, fastest spectral scanning capability and excellent analysis-oriented functionality offering integrated solutions for advanced materials research... Read more
April 6, 2011 (Peabody, Mass.) — Effective April 1, 2011, JEOL, Ltd., (Akishima, Japan), a global leader in the design and manufacture of scientific instrumentation, and the Innovation Network Corporation of Japan (INCJ) have formed a new joint venture company dedicated to the development of next-generation NMR instrumentation. The new spinoff, JEOL Resonance, Inc., will... Read more
Observation of cells in a water environment at a higher resolution than is possible in optical microscopy https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/107/Cancer-Research-using-the-ClairScope Read more
October 25, 2010 (Peabody, Mass.) — JEOL USA announced today that the new David H. Koch Institute for Integrative Cancer Research, opening in November at the Massachusetts Institute of Technology (MIT), has selected the JEOL JEM-2100F Transmission Electron Microscope for its new microscopy core. The 200kV Field Emission TEM offers a highly flexible platform for... Read more
September 21, 2010 (Peabody, Mass.) — JEOL offers a whole new electron microscope experience with the introduction of the InTouch Scope™, an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The new InTouch Scope has the familiar feel of today’s personal electronic... Read more
September 20, 2010 (Peabody, MA) — JEOL announces a major order for the company’s atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured... Read more
August 31, 2010 (Peabody, Mass.) — JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other... Read more