April 17, 2012 Microscopy Product Launch

JEOL Introduces New Versatile FE-SEM Series for Sub-Nanometer Imaging and Analysis of Nanostructures and Magnetic Samples

April 17, 2012 (Peabody, Mass.) — JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a... Read more

February 6, 2012 Product Launch

The New Repository on the Block

The need for data validation and accessibility has never been greater than it is today. We are inundated with information from a multitude of resources, but how can we easily evaluate the accuracy of that data? In the past, the peer review process provided this and was often run by publishers. Read more

November 11, 2011 Uncategorized

Japanese Consul Visits JEOL USA Scientific Instrument Supplier

November 10, 2011 (Peabody, Mass.) JEOL USA, a leading supplier of scientific instruments in the Americas, was honored by a visit from the Consul General of Japan in Boston, Mr. Takeshi Hikihara, on Wednesday, November 9, 2011. As a representative of the Foreign Ministry, Mr. Hikihara serves Japanese communities and businesses throughout New England. JEOL... Read more

October 20, 2011 PR/Corporate

JEOL Chemist Receives Prestigious Anachem Award

October 20, 2011 (Peabody, Mass.) — JEOL USA Mass Spectrometry Product Manager, Dr. Robert (Chip) Cody, has received the prestigious Anachem Award, given by the Association of Analytical Chemistry for his contributions to the development of organic mass spectrometry. The award was presented at the Federation of Analytical Chemical and Spectroscopy Societies (FACSS) meeting in... Read more

October 3, 2011 Product Launch

JEOL Opens New Office in Brasil

October 3, 2011 (Peabody, Mass.) — A leading supplier of electron microscopes and scientific instrumentation, JEOL USA (Peabody, Mass.) and its parent company JEOL Ltd. (Akishima, Japan) have opened an office in Sao Paulo, Brasil to support its growing installed base there, and have relocated the personnel to a new facility this month. JEOL has... Read more

September 28, 2011 M&A, Partnerships

JEOL USA Partners with Chilean Agent Arquimed

September 27, 2011 (Peabody, MA) — JEOL USA, a leading supplier of scientific and industrial instrumentation including electron microscopes, mass spectrometers and nuclear magnetic resonance spectrometers, and headquartered in Peabody, Massachusetts, has entered an agreement with Arquimed, Ltda. making Arquimed JEOL’s exclusive agent in Chile. Arquimed, located in Santiago, has a 75-year history as one... Read more

July 13, 2011 Microscopy Product Launch

JEOL Unveils New High Throughput, Automated TEM for Nano-analysis

July 12, 2011 (Peabody, Mass.) — A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS);... Read more

July 8, 2011 Acad, Gov/Utilities Microscopy Product Launch

New JEOL Large Angle Energy Dispersive Spectrometer (EDS) for Ultrafast Elemental Mapping of S/TEM Samples

July 7, 2011 (Peabody, Mass.) — JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of... Read more

June 30, 2011 Environ, Ag./Food & Bev Microscopy Product Launch

JEOL Introduces New Environmental Control System for Scientific Instrument Labs

June 30, 2011 (Peabody, MA) — Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting the room, and the enclosed facility itself can all affect the performance of sensitive instrumentation. To help ensure optimum instrument performance and maintain... Read more