December 10, 2013 (Peabody, Mass.) — JEOL, Ltd., a world leader in electron microscopy, has announced a joint initiative between JEOL and Gatan that brings the power of Serial Block Face imaging to the JEOL family of scanning electron microscopes. Researchers will be able to image 3D structures of biological and materials samples at ultrahigh... Read more
Since its introduction in the 1600s, improvements in microscope technology have continually broadened the types of cells and cellular processes that can be studied. Advances in automation have made this already-simple tool faster and more capable, and time-lapse imaging reveals function and dynamics in addition to structure. Live-cell imaging has enabled us to witness incredible... Read more
JASCO redefines infrared application techniques with the NEW! FTIR-4600/4700/6600/6700/6800 Series Spectrometers JASCO is pleased to announce the new FTIR-4000/6000 Series Spectrometers offering the best S/N ratio, unparalleled sensitivity, and vibration-free scanning. The JASCO FTIR-4000/6000 Series instruments redefine the application of this powerful, easy-to-use technique. Each compact model offers reliable operation with the highest signal-to-noise ratio... Read more
When Stefan Hell invented a technique that pushed beyond the diffraction limit of light for the first time, a new field of nanoscale imaging was born. Now laboratories around the world are using STED microscopy to smash through more boundaries in fundamental science. Read more
September 4, 2013 (Peabody, MA) — JEOL introduces a new Scanning Electron Microscope with expanded pressure range, large specimen chamber, and unsurpassed resolution for imaging and characterizing a wide variety of sample types and sizes. The JSM-IT300LV is the latest addition to JEOL’s popular series of tungsten low vacuum SEMs. This all-new design builds upon... Read more
August 5, 2013 (M&M 2013, Indianapolis, Indiana) — JEOL USA will demonstrate its new JEM-1400Plus, a 120kV Transmission Electron Microscope, at Microscopy & Microanalysis (M&M) 2013 in Indianapolis, Indiana, from August 5-8. Based on the popular JEM-1400, the new TEM is making its debut in the United States at the annual meeting of the Microscopy... Read more
Since super-resolution microscopy techniques revolutionized the concept of light microscopy by overcoming the physical diffraction limit, STED microscopy and other super-resolution techniques have aroused considerable interest. The diffraction limit imposes no more constraints on resolution. New microscopes with ever-decreasing resolution limits are being developed, for instance by the inventor of STED microscopy, Prof. Stefan Hell,... Read more
July 19, 2013 – Boulder, CO – GE Analytical Instruments, a division of GE Water & Process Technologies, received the Excellence in Waste Diversion award from Western Disposal for their 2012 Zero Waste efforts. Robert F. Kennedy Jr., environmental advocate for 30 years, was the keynote speaker at the June 12 Boulder Earth Conference where... Read more
JASCO continues to revolutionize the characterization of biomolecules NEW! J-1000 Series Circular Dichroism Spectrometers JASCO is pleased to announce the new J-1000 Series CD Spectrometers offering unparalleled sensitivity, with reach from the vacuum UV to the NIR wavelengths. Also, introducing Simultaneous Multi-Probe Spectroscopy (SMP) which consists of three modes (CD, LD and Absorbance) running concurrently... Read more
(Peabody, Mass. June 7, 2013) — JEOL USA, Inc. (Peabody, MA) has concluded an OEM agreement with Zoex Corporation (Houston, TX) to offer the Zoex comprehensive two-dimensional gas chromatography (GC x GC) technology with the new JEOL AccuTOF GCV 4G high-resolution time-of-flight mass spectrometer system. “We are very excited about the partnership with Zoex. The... Read more