Takara Bio grants Cellectis SA a commercial license to use RetroNectin®

2016 2016/03/22 Takara Bio grants Cellectis SA a commercial license to use RetroNectin® Kusatsu/Shiga, Japan – March 22, 2016 – Takara Bio Inc. announces that it has entered into a License and Supply Agreement with Cellectis SA. Under the agreement, Takara Bio grants Cellectis a commercial license to use RetroNectin® and Takara Bio also supplies RetroNectin® to Cellectis . ... Read more

Charles Koontz Appointed President and CEO of GE Healthcare IT and GE Healthcare Chief Digital Officer

BARRINGTON, IL., March 9, 2016 — GE Healthcare (NYSE: GE) today announced the appointment of Charles Koontz as president and CEO of GE Healthcare IT and GE Healthcare Chief Digital Officer, effective March 14. Koontz succeeds Jan De Witte, who is leaving GE. Koontz joins GE from Computer Sciences Corp (CSC) and CSRA, where he was... Read more

Path Links, a pathology network in Northern Lincolnshire, upgrades to digital pathology to enhance cancer diagnostics capability

Lincoln, UK, 08 March 2016 – Path Links, the single managed NHS clinical pathology service operating across Lincolnshire, has upgraded to digital pathology to continue its focus on providing the highest quality diagnostic services for Northern Lincolnshire & Goole NHS Foundation Trust, United Lincolnshire Hospitals NHS Trust and 186 General Practices across the county. Path... Read more

JEOL Demonstrates New Analytical Technology at Pittcon 2016

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta GA) — JEOL USA (Booth #2857) will unveil several new analytical technologies during Pittcon 2016 in Atlanta, Georgia. With a comprehensive line of time-of-flight mass spectrometers, high resolution scanning (SEM) and transmission (TEM) electron microscopes, and the latest in... Read more

JEOL Debuts InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer for Real-time Gas Analysis

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta, GA) — At Pittcon 2016 (booth #2857), JEOL will debut the new InfiTOF, a compact high-resolution mass spectrometer designed for real-time gas analysis. The InfiTOF’s unique multi-turn ion optics provide high-resolution mass spectra in a system that is the... Read more

New PhotoIonization (PI) Source and a new Application for JEOL’s Fourth-Generation AccuTOF-GCX High-Resolution GC/Time-of-Flight Mass Spectrometer

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta, GA) – JEOL introduces a new combination electron ionization/photoionization (EI/PI) source for JEOL’s fourth-generation AccuTOF-GCX high-resolution time-of-flight mass spectrometer. The new EI/PI source complements the dedicated electron ionization (EI), positive/negative chemical ionization (CI), field desorption/field ionization (FD/FI) and combination... Read more

Powerful Problem-solving Mass Spectrometer Demonstrations at Pittcon 2016 – JEOL AccuTOF-DART 4G

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta, GA) — At Pittcon 2016 (Booth #2857) JEOL will demonstrate the latest features of the game-changing open air ambient ionization mass spectrometer system. This third-generation AccuTOFTM-DART® 4G couples the facile operation of the DART (Direct Analysis in Real Time)... Read more

Big Picture Plus Analysis from a Small, Compact, and Versatile Benchtop SEM – The JSM-6000PLUS NeoScope from JEOL

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016, Atlanta, Georgia) — JEOL introduces a new benchtop SEM at Pittcon 2016: the JSM-6000Plus, the third generation of the popular NeoScope. The NeoScope delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs. The JSM-6000Plus model offers... Read more

JEOL Tungsten SEM with Smart Analytical Port Geometry Demonstrated at Pittcon 2016

FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 7, 2016 (Pittcon 2016 Atlanta, GA) — JEOL will demonstrate its high resolution analytical Scanning Electron Microscope in Booth #2857 during the week of Pittcon 2016. The JSM-IT300LV Scanning Electron Microscope is a versatile research grade SEM for high throughput imaging and microanalysis. A... Read more

Nikon Instruments Inc. Receives iF Gold Award for Design Excellence

MELVILLE, N.Y., March 03, 2016 (GLOBE NEWSWIRE) — Nikon Instruments Inc. is pleased to announce that Inverted Microscopes ECLIPSE Ts2R and ECLIPSE Ts2 have been recognized with the iF Gold Award, a globally prestigious design recognition sponsored by iF International Forum Design GmbH since 1953. The ECLIPSE Ts2R and ECLIPSE Ts2 were awarded in the... Read more