New Gather-X Windowless EDS From JEOL Answers The Need For Higher Sensitivity And Low-Energy X-Ray Detection In SEM
August 1, 2022 (M&M 2022 Portland, Oregon) JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest Energy Dispersive Spectrometer (EDS), the Gather-X. This new windowless EDS answers the need for higher sensitivity and low-energy X-Ray detection in the Scanning Electron Microscope (SEM). It can collect the... Read more