Pristine Sample Preparation for SEM Using Broad Ion Beam Milling
Feb. 22, 2021 Peabody, Mass. – JEOL USA introduces a new configuration of its bestselling broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging and elemental analysis with the Scanning Electron Microscope (SEM). The upgraded configuration includes high-speed milling, sputter coating, cryo-preparation... Read more