JEOL, renowned for its expertise in the manufacture and applications support of scientific instrumentation for sixty years, has produced a new brochure for 2009 describing electron microscopy and mass spectrometry solutions for forensic science.
The brochure includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links to profiles of real case studies involving the use of JEOL Scanning Electron Microscopes (SEM).
Demonstrations at American Academy of Forensic Science Meeting (AAFS)
Featured in the brochure is the CarryScope mobile SEM, a self-contained SEM for easy transport between labs, which JEOL USA will demonstrate at the American Academy of Forensic Science (AAFS) meeting in Denver, Colorado, February 16-21. Data on forensics applications of the AccuTOF-DART mass spectrometer, which characterizes composition of explosives, drugs, inks, accelerants, and fingerprints directly from surfaces, vapor, or liquids in real time, will be exhibited in the booth.
Congratuations to Emerging Forensic Scientists
JEOL USA congratulates the AAFS winner of the Emerging Forensic Scientist award, Heidi Barron Nawrocki, who will present her paper “Discrimination of Glass by Cathodoluminescence, Color Analysis, and Chemometrics” at the Young Scientists Forum on Tuesday, February 17th, and Whitney Hill of MVA Scientific Consultants, the company profiled on JEOL USA’s website www.jeolusa.com in JEOL’s REALab series of case studies.
For more information on JEOL instrumentation for forensics, please visit our website at http://www.jeolusa.com/Forensics.
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