FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com May 5, 2015 – Peabody, MA — A state-of-the-art JEOL e-beam lithography system will soon be a new resource for quantum information science researchers that utilize the cutting-edge facilities at the University of Waterloo Quantum NanoFab in Waterloo, Ontario. The JEOL JBX-6300FS e-beam system will... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com March 9, 2015 Peabody, MA — The JEOL AccuTOF-GCx will be exhibited for the first time in the U.S. at Pittcon 2015 in New Orleans, booth #1523. The AccuTOF-GCx, the fourth generation of JEOL’s successful gas chromatography/time-of-flight mass spectrometer systems, is designed for optimum throughput,... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com February 19, 2015, Peabody, MA — With the increased frequency in the use of improvised explosive devices (IEDs), there is a growing need for crime scene investigators to rapidly detect minute traces of explosive materials as well as link the devices to a person of... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com (January 13, 2015 — Peabody, Mass.) JEOL USA and the University of California’s Irvine Materials Research Institute (IMRI) have entered into a strategic partnership to create a premier electron microscopy and materials science research facility. The IMRI will serve as an interdisciplinary nexus for the... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com December 15, 2014 (Peabody, MA) — JEOL USA is pleased to announce a new program that, for a limited time, offers NMR users in the Americas the opportunity to replace their NMR consoles at a special price. For more than 50 years, JEOL has been... Read more
FOR IMMEDIATE RELEASE CONTACT:Patricia Corkum, Marketing Manager978-536-2273 • pcorkum@jeol.com • www.jeolusa.com October 7, 2014 (Peabody, MA) — JEOL has introduced an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The JSX-1000S ElementEye analyzes major to trace components on most sample types – solids, powders, and liquids – with little or no... Read more
Expertise Library All the knowledge resources and product documentation in one place: catalogues, brochures, datasheets, user manuals, white papers, guides, handbooks, case studies, magazines, usercoms, webinars, videos, operating instructions, certificates and more. https://www.mt.com/content/us/en/home/supportive_content/press-releases/Chemical_eBooklet.html Read more
Expertise Library All the knowledge resources and product documentation in one place: catalogues, brochures, datasheets, user manuals, white papers, guides, handbooks, case studies, magazines, usercoms, webinars, videos, operating instructions, certificates and more. http://www.mt.com/content/us/en/home/supportive_content/press-releases/Chemical_eBooklet.html Read more
March 18, 2010, Peabody, Mass. — JEOL USA and the University of Texas at Dallas (UTD) today jointly announced the University’s acquisition of the new JEOL atomic resolution Transmission Electron Microscope (TEM). The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the... Read more