June 30, 2022 Atomic Spectroscopy Industrial Product Launch

SPECTRO Announces SPECTROMAXx LMX10 ARC/SPARK OES Analyzer for Next-Generation Material Control Analysis

June 30, 2022 SPECTRO Analytical Instruments has introduced the SPECTROMAXx LMX10 ARC/SPARK OES analyzer for fast, accurate, advanced elemental analysis in metal producing and fabricating plants, and iron and non-ferrous foundries. The LMX10 is the newest version of SPECTROMAXx, perhaps the industry’s best-selling arc/spark optical emission spectrometry (OES) analyzer. SPECTROMAXx delivers outstanding repeatability, reproducibility, and reliability in... Read more

February 9, 2022 Industrial Microscopy

Precision Fabrication of Nano Patterns for Semiconductor Devices

Semiconductor devices are used in integrated circuits (IC) such as computer processors, microcontrollers and memory chips. These are present in everyday electrical and electronic devices. Their fabrication involves a sequence of photolithographic and chemical processing steps during which electronic circuits are gradually created on a wafer. The availability of metrology solutions, one of the critical... Read more

September 20, 2021 Industrial Liq. Handling & Robotics M&A, Partnerships Microscopy

Brooks Automation Announces Agreement To Sell Its Semiconductor Solutions Group Business To Thomas H. Lee Partners

Brooks Automation Announces Agreement To Sell Its Semiconductor Solutions Group Business To Thomas H. Lee Partners CHELMSFORD, Mass., Sept. 20, 2021 /PRNewswire/ — Brooks Automation, Inc. (Nasdaq: BRKS) today announced that it has entered into a definitive agreement to sell its Semiconductor Solutions Group business (or “automation business”) to Thomas H. Lee Partners, L.P. (“THL”) for... Read more

November 27, 2020 Industrial Microscopy Product Launch

Hitachi High-Tech Launches 3D SEM CT1000

Helping to ensure quality and reliability of semiconductor devices in the IoT and automotive fields Tokyo, November 27, 2020 – Hitachi High-Tech Corporation (President and CEO: Masahiro Miyazaki / Hitachi High-Tech) announced today the launch of the 3D SEM*1 CT1000, that is required for defect observation in the semiconductor industry. This product enables 3D observation of... Read more

November 26, 2020 Industrial Microscopy Product Launch

Hitachi High-Tech Launches New High-Speed Defect Review SEM CR7300

– Review SEM Featuring Double Defect Imaging Speed – Tokyo, November 26, 2020 – Hitachi High-Tech Corporation (President and CEO: Masahiro Miyazaki / Hitachi High-Tech) announced today the launch of the high-speed defect review SEM*1 CR7300. The CR7300 is a new model of review SEM that will contribute to the productivity improvement in the manufacturing of... Read more

November 10, 2020 Industrial Informatics & Software Product Launch

Introducing “Chemicals Informatics”: Software to Streamline New Product Research in the Chemical Industry

Tokyo, November 10, 2020 – Hitachi High-Tech Corporation today announced that Hitachi High-Tech Solutions Corporation (President: Masahiro Taniguchi / Hitachi High-Tech Solutions) is launching Chemicals Informatics – a new piece of software designed to help bring new high-value-added materials to market faster, as research and development (R&D) processes in the chemical sector has become more... Read more

November 2, 2020 Industrial Microscopy PAI Top-10

Structuring Semiconductor Materials with Atomic Precision

Researchers use helium ion microscopy to engineer atomic defects in molybdenum disulfide (MoS2) Prof. Alexander Holleitner, Dr. Christoph Kastl, and Elmar Mitterreiter, who performed the HIM-lithography at the atomistic limit. Prof. Alexander Holleitner and his group head the Center of Nanotechnology and Nanomaterials of the Walter Schottky Institute (WSI) of TUM. As the name implies,... Read more

July 30, 2020 Industrial Lab Top-10 Microscopy

Thermo Scientific nProber IV Delivers Faster, Easier Failure Analysis Process for Semiconductor Labs

Thermo Scientific nProber IV Delivers Faster, Easier Failure Analysis Process for Semiconductor Labs New platform provides faster identification of defects that impact device performance HILLSBORO, Ore., July 30, 2020 /PRNewswire/ — Thermo Fisher Scientific today released the Thermo Scientific nProber IV nanoprober platform, a fault isolation system used by semiconductor fabs to precisely locate and... Read more

April 15, 2020 Bio/Pharma/CRO Industrial Lab Top-10 Microscopy Product Launch

PerkinElmer Launches Solutions to Streamline Analysis for Labs in Pharmaceuticals, Semiconductors, Biomonitoring, Food and Materials

Multi-Quadrupole ICP-MS, FT-IR and automation innovations provide testing and research performance, flexibility and ease of use WALTHAM, Mass. – April 15, 2020 – PerkinElmer, Inc., a global leader committed to innovating for a healthier world, today expanded its analysis and automation portfolio for quality, safety and content testing. Geared for pharmaceutical, semiconductor, biomonitoring, food, materials... Read more

November 12, 2019 Industrial Lab Top-10 Microscopy

Thermo Fisher Centrios Improves Semiconductor Circuit Editing for Process Nodes 14nm and Above

Thermo Fisher Centrios Improves Semiconductor Circuit Editing for Process Nodes 14nm and Above Next-generation, cost-effective solution for front- and back-side edits enables rapid prototyping PORTLAND, Ore., Nov. 12, 2019 /PRNewswire/ — Circuit edit (CE) engineers, whether supporting designers or in service labs, who are looking for a cost-effective solution can increase their productivity with the next-generation... Read more