August 13, 2012 – Boulder, CO – On April 1, 2011, the Japanese Pharmacopeia (JP) published changes in the JP 16 monograph that described new analytical testing requirements for Purified Water (PW) and Water for Injection (WFI). These changes will directly affect the validation of new and existing Total Organic Carbon (TOC) analyzers used for... Read more
May 1, 2012 – Boulder, CO – GE Analytical Instruments is pleased to announce the new Smart Leakwise Controller (SLC-220), a digital signal processor that interfaces with Leakwise ID-220 Oil-on-Water Monitoring Sensors to report hydrocarbons spill/leak alerts, including layer buildup and thickness. The SLC-220 enables communications via a wide variety of outputs and communication interfaces for... Read more
July 7, 2011 (Peabody, Mass.) — JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of... Read more
September 20, 2010 (Peabody, MA) — JEOL announces a major order for the company’s atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured... Read more
August 31, 2010 (Peabody, Mass.) — JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other... Read more
July 13, 2010 (Peabody, Mass.) – This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M)... Read more
May 24, 2010 (Peabody, MA) — Who says science isn’t fun? In their daily work, experienced microscopists at JEOL USA Inc. in Peabody, Massachusetts look at every kind of sample imaginable – paper, neurons in the brain, ceramics, semiconductors, insects, and forensic evidence, to name just a few – through the state-of-the-art scanning electron microscopes... Read more
February 18, 2010 (Peabody, Mass.) — The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information... Read more
December 16, 2009 (Peabody, Mass.) — The University of Texas El Paso has selected a JEOL cryo-electron microscope for its emerging structural biology program to be housed in a new building planned for completion in 2011 on the UTEP campus. The JEM-3200FS that was ordered from JEOL USA is a 300 keV cryo-TEM with an... Read more
With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new... Read more