New JEOL Large Angle Energy Dispersive Spectrometer (EDS) for Ultrafast Elemental Mapping of S/TEM Samples

July 7, 2011 (Peabody, Mass.) — JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM). Centurio from JEOL is a novel Silicon Drift Detector (SDD) EDS that collects X-rays from samples at an unprecedented large solid angle of... Read more

National Government Standards Lab Selects JEOL Atomic Resolution Microscope for R&D

September 20, 2010 (Peabody, MA) — JEOL announces a major order for the company’s atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured... Read more

Emory University Orders Two JEOL Cryo-TEMs for Expanding the Electron Microscopy Core

August 31, 2010 (Peabody, Mass.) — JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materials research, announces that Emory University in Atlanta, Georgia, has selected two JEOL TEMs for the Robert P. Apkarian Integrated Electron Microscopy Core (RPAIEMC). The two TEMs, one operating at 120kV and the other... Read more

New JEOL Correlative Microscope Makes U.S. Debut at M&M and Northwestern University after Winning R&D 100 Award

July 13, 2010 (Peabody, Mass.) – This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state. The new JEOL ClairScope will make its debut in the United States at Microscopy & Microanalysis (M&M)... Read more

First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

February 18, 2010 (Peabody, Mass.) — The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information... Read more

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso

December 16, 2009 (Peabody, Mass.) — The University of Texas El Paso has selected a JEOL cryo-electron microscope for its emerging structural biology program to be housed in a new building planned for completion in 2011 on the UTEP campus. The JEM-3200FS that was ordered from JEOL USA is a 300 keV cryo-TEM with an... Read more

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University

With just the right touch for fine tuning the optics of ultrahigh resolution microscopes, JEOL Applications Specialist Dr. Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new... Read more

New JEOL Atomic Resolution Microscope to Aid Advanced Material Research at Florida State University

April 28, 2009 (Peabody, MA) — For now, scientists at Florida State University (FSU) can only envision what some misoriented atoms are up to along the defects of the new materials that they are developing. They’ll finally be able to clearly see each individual atom and how it relates to its neighbors when they take... Read more