JEOL Introduces Multiple Software Enhancements to Advance TEM Imaging and Data Acquisition
July 28, 2008 (Peabody, MA) — JEOL, the global leader in electron microscopy for nearly 60 years, will demonstrate a variety of new software packages for its 120kV to 300kV series of Transmission Electron Microscopes (TEMs) in booth #1027 at the M&M 2008 Microscopy and Microanalysis exhibit in Albuquerque, New Mexico from August 4-7. Exploring... Read more