National Government Standards Lab Selects JEOL Atomic Resolution Microscope for R&D
September 20, 2010 (Peabody, MA) — JEOL announces a major order for the company’s atomic resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM), from the National Institute of Standards and Technology (NIST). The purchase was made through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured... Read more