Matters of legal in nature including licensing, intellectual property, and lawsuits.
March 28th, 2007, Peabody, Mass. — JEOL USA, a leading supplier of scientific instruments in the Americas, is proud to announce that JEOL Technics, one of the company’s design and manufacturing branches in Akashima, Japan, has shipped its 10,000th Scanning Electron Microscope (SEM). Since JEOL, Ltd. was founded in 1949, more than 6,000 JEOL instruments... Read more
November 28, 2006 (Peabody, Mass.) — JEOL USA Inc. today announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent No. 7,112,785 by the U.S. Patent and Trademark office. The patent covers the method of ionization of the DART process. This is the second U.S. patent... Read more
Peabody, Mass., December 7, 2005 – The USA subsidiary of JEOL Ltd., an international supplier of electron microscopes and analytical instruments, has entered into a partnership agreement with Massachusetts Institute of Technology’s Institute for Soldier Nanotechnologies (ISN). The mission of the ISN, a research collaboration between the United States Army and MIT, is to develop... Read more
Peabody, Mass., September 30, 2005 – JEOL USA today announced that the United States Patent Office has awarded patent number 6,949,741, dated September 27, 2005, to JEOL USA, Inc. for the DART™ Direct Analysis in Real Time atmospheric pressure ion source. The DART, commercially introduced in February 2005 for the JEOL AccuTOF™ mass spectrometer, was... Read more