June 7, 2013 Acad, Gov/Utilities Chromatography Licensing, IP, and Legal M&A, Partnerships Mass Spectrometry

JEOL and Zoex Partnership Combines Comprehensive Two-Dimensional Gas Chromatography with High Sensitivity Mass Spectrometer

(Peabody, Mass. June 7, 2013) — JEOL USA, Inc. (Peabody, MA) has concluded an OEM agreement with Zoex Corporation (Houston, TX) to offer the Zoex comprehensive two-dimensional gas chromatography (GC x GC) technology with the new JEOL AccuTOF GCV 4G high-resolution time-of-flight mass spectrometer system.  “We are very excited about the partnership with Zoex. The... Read more

July 31, 2008 Informatics & Software Licensing, IP, and Legal M&A, Partnerships Microscopy

JEOL Introduces Multiple Software Enhancements to Advance TEM Imaging and Data Acquisition

July 28, 2008 (Peabody, MA) — JEOL, the global leader in electron microscopy for nearly 60 years, will demonstrate a variety of new software packages for its 120kV to 300kV series of Transmission Electron Microscopes (TEMs) in booth #1027 at the M&M 2008 Microscopy and Microanalysis exhibit in Albuquerque, New Mexico from August 4-7. Exploring... Read more

July 11, 2008 Licensing, IP, and Legal Microscopy Product Launch

A New FRAP/FRAPa Method for Three-Dimensional Diffusion Measurements Based on Multiphoton Excitation Microscopy

Quantitative measurement method based on FRAP and FRAPa using multiphoton microscopy. We present a new convenient method for quantitative three-dimensionally resolved diffusion measurements based on the photobleaching (FRAP) or photoactivation (FRAPa) of a disk-shaped area by the scanning laser beam of a multiphoton microscope. Contrary to previously reported spot-photobleaching protocols, this method has the advantage... Read more

March 28, 2007 Licensing, IP, and Legal

JEOL Technics Ships 10,000th Unit

March 28th, 2007, Peabody, Mass. — JEOL USA, a leading supplier of scientific instruments in the Americas, is proud to announce that JEOL Technics, one of the company’s design and manufacturing branches in Akashima, Japan, has shipped its 10,000th Scanning Electron Microscope (SEM). Since JEOL, Ltd. was founded in 1949, more than 6,000 JEOL instruments... Read more

December 7, 2005 Licensing, IP, and Legal M&A, Partnerships

JEOL USA and MIT Institute for Soldier Nanotechnologies Enter Partnership Agreement

Peabody, Mass., December 7, 2005 – The USA subsidiary of JEOL Ltd., an international supplier of electron microscopes and analytical instruments, has entered into a partnership agreement with Massachusetts Institute of Technology’s Institute for Soldier Nanotechnologies (ISN). The mission of the ISN, a research collaboration between the United States Army and MIT, is to develop... Read more

September 30, 2005 Licensing, IP, and Legal PR/Corporate

DART™ Awarded U.S. Patent

Peabody, Mass., September 30, 2005 – JEOL USA today announced that the United States Patent Office has awarded patent number 6,949,741, dated September 27, 2005, to JEOL USA, Inc. for the DART™ Direct Analysis in Real Time atmospheric pressure ion source. The DART, commercially introduced in February 2005 for the JEOL AccuTOF™ mass spectrometer, was... Read more