Rigaku Oxford Diffraction (ROD) Introduces New High-flux Dual Wavelength X-ray Diffractometer

Rigaku Oxford Diffraction debuts new XtaLAB Synergy-DW dual wavelength chemical crystallography X-ray diffractometer

October 6, 2017 – The Woodlands, TX. Rigaku Oxford Diffraction announced the release of a new dual wavelength single crystal diffractometer, the XtaLAB Synergy-DW, at the 24th Congress & General Assembly of the International Union of Crystallography (IUCr).
The XtaLAB Synergy-DW system is a versatile high-flux diffractometer with a Hybrid Photon Counting (HPC) detector, offering two wavelengths in one compact system for 3D chemical structure analysis. The system is configured with a fast and efficient four-circle kappa goniometerthat is compatible with a wide range of detectors.

Combining the increased flux of a rotating anode source with the flexibility of two different wavelengths, the new system is uniquely suited to laboratories exploring a wide range of research interests.

The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode X-ray generator. The target is constructed with two different source materials – copper and molybdenum- and is coupled with an auto-switching dual wavelength optic. The XtaLAB Synergy-DW system offers up to 12 times higher flux compared to standard sealed tube sources, yet overall maintenance requirements are reduced due to the use of a single generator.

The system features the latest version of the highly regarded CrysAlisPro data collection and data processing software from Rigaku Oxford Diffraction, optimizing the exceptionally fast system for generating 3D structures of crystalline materials.

More information about single crystal diffraction solutions from Rigaku is available at www.rigaku.com/en/smc.