Rigaku to Feature Latest Instruments at American Chemical Society National Meeting & Exposition

Rigaku will be in attendance at the 2017 American Chemical Society National Meeting & Exposition, promoting its benchtop XRD and XRF spectrometers

July 25, 2017 – The Woodlands, TX. Rigaku Corporation is pleased to announce its attendance at the 254th American Chemical Society National Meeting & Exposition (ACS) in Washington, D.C., Sunday, August 20, 2017 through Thursday, August 24, 2017.

The exposition will be held at the Walter E. Washington Convention Center, where the new benchtop single crystal X-ray diffractometer – the XtaLAB mini II – will be shown.

In addition, Rigaku will be presenting its lines of benchtop X-ray diffraction (XRD) and X-ray fluorescence (XRF) spectroscopy instrumentation at Booth 1710.

The theme of the event will be “Chemistry’s Impact on the Global Economy.” Lectures and a plenary session promoting understanding of how chemistry can provide solutions the world’s mounting challenges and bring about a better world will be held, along with a number of symposia and special events.