July 10, 2012 (Semicon West, San Francisco, CA) — Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes and traditional SEMs in the lab.
Now JEOL introduces the NeoScope with higher magnification, multi-touch screen control, and a sleek new design.
As simple to use as a digital camera, the NeoScope is a high resolution SEM that produces images with a large depth of field at magnifications ranging from 10X – 60,000X. It features both high and low vacuum operation, three selectable accelerating voltages, and secondary electron and backscattered electron imaging. The NeoScope accommodates samples up to 70mm in diameter and 50mm in thickness. Both conductive and non-conductive samples can be examined. Optional EDS is available for elemental analysis.
An additional new feature of the NeoScope SEM is touch screen interface with the familiar look and feel of today’s smart phones and touch pads. Automatic functions as well as pre-stored recipe files make it easy to use for a multitude of sample types. Any skill level of user will appreciate the simplicity and fast operation, from sample loading to imaging in vacuum in less than three minutes.
Visit www.nikoninstruments.com or www.jeolusa.com for more information about the NeoScope from JEOL.
https://www.jeolusa.com/NEWS-EVENTS/Press-Releases/PostId/122/JEOL-Puts-a-New-Spin-on-its-Benchtop-SEM-NeoScope